Search results for " CV measurement"

Impact of transparent conductive oxide on the admittance of thin film solar cells

2010

Abstract The impact of transparent electrically conducting oxide (TCO) on the admittance measurements of thin film p–i–n a-Si:H solar cells was investigated. Admittance measurements on solar cell devices, with different area and geometry, in a wide range of frequencies and biases were performed. The admittance measurements of the investigated solar cells, which use the TCO as an electrical contact, showed that the high frequency admittance per area unit depends on the area. This effect increases both with the probe frequency and the size of the solar cells. Transmission line model valid for strip geometry which explains how the resistivity of the TCO layer impacts the measured admittance of…